发明名称 AN IN-SITU CHAMBER CLEAN PROCESS TO REMOVE BY-PRODUCT DEPOSITS FROM CHEMICAL VAPOR ETCH CHAMBER
摘要 A method and apparatus for cleaning a processing chamber comprising blocking a flow of cooling fluid to a channel within a support member within a processing chamber, elevating the support member to be within about 0.1 inches of a gas distribution plate, heating the gas distribution plate, and introducing a thermally conductive gas through the gas distribution plate into the processing chamber. In one aspect, the chamber comprises a chamber body and a support assembly at least partially disposed within the chamber body adapted to support a substrate thereon. The chamber further comprises a lid assembly disposed on an upper surface of the chamber body. The lid assembly includes a top plate and a gas delivery assembly which define a plasma cavity therebetween, wherein the gas delivery assembly is adapted to heat the substrate. A remote plasma source having a U-shaped plasma region is connected to the gas delivery assembly.
申请公布号 KR20070087196(A) 申请公布日期 2007.08.27
申请号 KR20077016827 申请日期 2007.07.20
申请人 APPLIED MATERIALS INC. 发明人 KAO CHIEN TEH;CHOU JING PEI;UMOTOY SALVADOR P.;CHANG MEI;YUAN XIAOXIONG (JOHN);CHANG, YU;LU, XINLIANG;PHAN SEE ENG;KUANG WILLIAM;TZU GWO CHUAN;OR DAVID T.
分类号 C23C16/50 主分类号 C23C16/50
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