发明名称 ELECTRONIC DEVICE TEST SET AND CONTACT USED THEREIN
摘要 A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.
申请公布号 CA2579697(A1) 申请公布日期 2007.08.24
申请号 CA20072579697 申请日期 2007.02.26
申请人 JOHNSTECH INTERNATIONAL CORPORATION 发明人 SHELL, DENNIS B.;LOPEZ, JOSE E.;GILK, MATHEW L.
分类号 G01R1/06;G01R31/28 主分类号 G01R1/06
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