发明名称 |
ELECTRONIC DEVICE TEST SET AND CONTACT USED THEREIN |
摘要 |
A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.
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申请公布号 |
CA2579697(A1) |
申请公布日期 |
2007.08.24 |
申请号 |
CA20072579697 |
申请日期 |
2007.02.26 |
申请人 |
JOHNSTECH INTERNATIONAL CORPORATION |
发明人 |
SHELL, DENNIS B.;LOPEZ, JOSE E.;GILK, MATHEW L. |
分类号 |
G01R1/06;G01R31/28 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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