| 摘要 |
A testing apparatus for testing an electronic device is provided with a main frame for generating supply power to be supplied to the electronic device; a socket board provided with a socket for placing the electronic device; a test head for removably holding the socket board and supplying the electronic device with the supply power generated by the main frame through the socket board; a first bypass capacitor connected to a supply power transmission line in a test head through a relay; and a second bypass capacitor fixedly connected to the supply power transmission line in the socket board.
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