发明名称 SAMPLE FOR ORIENTATION STATE EVALUATION, MANUFACTURING METHOD OF THE SAMPLE FOR ORIENTATION STATE EVALUATION, AND ORIENTATION STATE EVALUATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring a fine domain smaller than the spot diameter of excitation light, by solving the problem, wherein the fine domain smaller than the spot diameter of excitation light cannot be measured in a method wherein a light-emitting polymer film reflecting the orientation state of a bedding orientation film is formed by applying a light-emitting polymer onto the sample whole surface and applying heating treatment as a means to examine orientation of the orientation film for a liquid crystal, and the orientation state is measured by measuring fluorescence generated, by irradiating the light-emitting polymer film with the excitation light. SOLUTION: The light-emitting polymer film is formed into an island shape, and this island is arranged at intervals larger than the spot diameter of the excitation light. Consequently, when the excitation light is irradiated, only the spot parts having the island shape emits fluorescence. The region, smaller than the spot diameter of the excitation light, can be analyzed by setting the island size to be smaller than the spot diameter of the excitation light. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007212269(A) 申请公布日期 2007.08.23
申请号 JP20060031992 申请日期 2006.02.09
申请人 SEIKO EPSON CORP 发明人 HIRAIWA TAKU
分类号 G01N21/64;G01M11/00;G02F1/13;G02F1/1337 主分类号 G01N21/64
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