发明名称 Semiconductor device having a sac through-hole
摘要 A process for manufacturing a semiconductor device includes the steps of: forming a gate oxide film and a gate electrode on a substrate; forming a SiCN protection film on the gate electrode; depositing an interlayer dielectric film for covering the SiCN protection film; etching the dielectric film in a self-alignment with the SiCN protection film to form a contact hole; and forming a contact plug connected to the surface of the substrate in the contact hole.
申请公布号 US2007197034(A1) 申请公布日期 2007.08.23
申请号 US20070700767 申请日期 2007.02.01
申请人 ELPIDA MEMORY INC. 发明人 MIYAHARA JIRO
分类号 H01L21/302;H01L21/461 主分类号 H01L21/302
代理机构 代理人
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