发明名称 MASS SPECTROSCOPE AND MASS SPECTROMETRY
摘要 PROBLEM TO BE SOLVED: To provide a mass spectroscope capable of measuring two ion sources of different pressure levels by changeover. SOLUTION: Sample gas separated by a GC column 1 is branched and introduced separately into a first ion source (for instance, an APCI ion source) 2, and a second ion source (for instance, an EI ion source) 3 with a pressure level lower than the first ion source. Further, a flow volume of the sample gas introduced to the APCI ion source 2 is set more than that introduced into the EI ion source, and pressure of each ion source is maintained, whereby, analysis by each ionization is enabled to carry out with good balance in an aspect of sensitivity. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007213934(A) 申请公布日期 2007.08.23
申请号 JP20060031585 申请日期 2006.02.08
申请人 HITACHI LTD 发明人 YAMADA MASUYOSHI;KAN MASAO;WAKE IZUMI
分类号 H01J49/26;G01N27/62;H01J49/10 主分类号 H01J49/26
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