发明名称 |
Form measuring instrument, form measuring method and form measuring program |
摘要 |
A form measuring instrument measures a form of a surface of an object to be measured using a contact to follow the surface. A pseudo-measurement point acquirer acquires positional coordinates of the reference point of the contact as pseudo-measurement points when the contact touches the object at a plurality of locations. A normal vector generator estimates a surface or line along the pseudo-measurement points from the pseudo-measurement points to calculate normal vectors extending from the pseudo-measurement points to the surface or line. A contact model locator locates contact models which specify the surface form of the contact so as to coincide the pseudo-measurement points with reference points of the contact models and so as to coincide attitudes of the contact on measurement with attitudes of the contact models. A measurement point calculator calculates cross points as measurement points, at which the normal vectors cross the surfaces of the located contact models.
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申请公布号 |
US2007198212(A1) |
申请公布日期 |
2007.08.23 |
申请号 |
US20070701438 |
申请日期 |
2007.02.02 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
KADOWAKI SOICHI;KOJIMA TSUKASA;GOTO TOMONORI |
分类号 |
G06F17/40 |
主分类号 |
G06F17/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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