发明名称 Form measuring instrument, form measuring method and form measuring program
摘要 A form measuring instrument measures a form of a surface of an object to be measured using a contact to follow the surface. A pseudo-measurement point acquirer acquires positional coordinates of the reference point of the contact as pseudo-measurement points when the contact touches the object at a plurality of locations. A normal vector generator estimates a surface or line along the pseudo-measurement points from the pseudo-measurement points to calculate normal vectors extending from the pseudo-measurement points to the surface or line. A contact model locator locates contact models which specify the surface form of the contact so as to coincide the pseudo-measurement points with reference points of the contact models and so as to coincide attitudes of the contact on measurement with attitudes of the contact models. A measurement point calculator calculates cross points as measurement points, at which the normal vectors cross the surfaces of the located contact models.
申请公布号 US2007198212(A1) 申请公布日期 2007.08.23
申请号 US20070701438 申请日期 2007.02.02
申请人 MITUTOYO CORPORATION 发明人 KADOWAKI SOICHI;KOJIMA TSUKASA;GOTO TOMONORI
分类号 G06F17/40 主分类号 G06F17/40
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