MEASURING SYSTEM FOR THE ACQUISITION OF THE LAYER THICKNESS OF A DEPOSIT

摘要

The invention relates to a measuring system for determining a characteristic of a deposit (12) that accumulates on the inside of a vessel wall (16), comprising: (a) at least one light-emitting unit (18, 20), comprising a first structure which is integrated in the vessel wall (16) and emits light into the vessel such that said light is scattered and/or reflected by said deposit (12), if any deposit is present, and (b) a detection unit (26), comprising (1) a second structure which is integrated in the vessel wall (16) and which is designed in such a manner that at least a portion of the light scattered and/or reflected by the deposit, if present, can pass from the interior of the vessel toward its exterior, and (2) a light detector (30) disposed such that its light-sensitive surface faces the second structure.