WAVEFRONT ANALYSIS METHOD INVOLVING MULTILATERAL INTERFEROMETRY WITH FREQUENCY DIFFERENCE

摘要

The invention relates to a wavefront analysis method involving multilateral interferometry with frequency difference. According to the invention, a diffraction grating (GR) with two-dimensional meshing is placed on the path of the beam to be analysed and at least two interferograms with at least two different colours are processed, each interferogram being obtained in a plane (P_s)_{from two sub-beams (R1, R2) with different diffraction orders. The invention can be used to analyse and correct sheared wavefronts (S).}