| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test disk production system by which a test disk can be produced without taking much time of a user. <P>SOLUTION: The system has a test data storage means 40; a best parameter set storage means 44 that stores a best parameter set; a test write means 36 that changes a value of a parameter in the best parameter set, and performs test write to an optical disk based on the changed parameter value; a write quality measurement means 34 that measures best parameter set of data; target write quality storage means 46; and a test parameter setting means 35 that reads data test-written by the test write means 36, compares the measured write quality with the target write quality, allows the test write means 36 to repeatedly perform test write until the measured write quality corresponds to the target write quality, and sets a value of a test write parameter as a test parameter when the measured write quality corresponds to the target write quality. <P>COPYRIGHT: (C)2007,JPO&INPIT |
