发明名称 INSPECTION METHOD OF POSITIONAL DEVIATION, PROGRAM AND INSPECTION DEVICE OF POSITIONAL DEVIATION
摘要 PROBLEM TO BE SOLVED: To inspect an error of sticking position of a polarizing plate which is stuck to a TFT array substrate and a color filter substrate. SOLUTION: An alignment mark AM formed on the TFT array substrate 10 is recognized, an X-axis and a Y-axis are preset within a vision of a camera 50 and the alignment mark AM is recognized. Further, on the basis of the recognized alignment mark AM as a reference, an X-directional search area XSA of the prescribed range in the X-direction where it is predicted that there is an edge line and a Y-directional search area YSA of the prescribed range in the Y-direction are preset. The X-directional search area XSA and the Y-directional search area YSA are scanned from the inside toward the outside and the edge line is detected in accordance with the change of light quantity. By making an intersecting point of the edge line an apex of the polarizing plate 20, the quantity of the error with the alignment mark AM is output. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007212939(A) 申请公布日期 2007.08.23
申请号 JP20060035093 申请日期 2006.02.13
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YUMIBA KENJI;TAKEDA MASAOMI;SUZUKI MASAMITSU
分类号 G02B5/30;G02F1/13 主分类号 G02B5/30
代理机构 代理人
主权项
地址