| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for inspection of transparent film that can exactly inspect the thickness unevenness of the transparent film caused by concave or convex cross section stripes of more than 10 mm width, when they are gently waved on the film surface. SOLUTION: In this method for inspection of transparent film, the transparent film is set between the light source and the screen that is arranged perpendicularly to the beam emitted from the light source so that the film may be inclined by a desired angle to the screen and the light passing through the transparent film is projected on the screen to measure the difference from the brightness of the image and the thickness uneveness of the transparent film is inspected by the brightness difference. COPYRIGHT: (C)2007,JPO&INPIT |
