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发明名称
Test von eingebetteten Schaltungen mit Hilfe einer separaten Versorgungs-Spannung
摘要
申请公布号
DE112005002812(A5)
申请公布日期
2007.08.23
申请号
DE200511002812T
申请日期
2005.12.09
申请人
X-FAB SEMICONDUCTOR FOUNDRIES AG
发明人
HABERLA, HOLGER;LOHBRANDT, SOEREN
分类号
G01R31/317;G01R31/3185
主分类号
G01R31/317
代理机构
代理人
主权项
地址
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