发明名称 Electrostatic discharge protection circuit protecting thin gate insulation layers in a semiconductor device
摘要 An electrostatic discharge protection circuit protects the internal circuits of a semiconductor. The electrostatic discharge protection circuit includes a first electrostatic protection unit connected to a power source supply pad. The first electrostatic protection unit discharges an ESD current into the power source supply pad when an ESD is introduced into the input/output pad, and generates a first driving voltage by utilizing the ESD current flow through a voltage-drop unit. A driver driven by the first driving voltage generates a second driving voltage by an ESD current. A second electrostatic protection unit discharges the introduced ESD current into the power source supply pad by the second driving voltage such that a voltage applied to a gate of the first NMOS transistor is reduced.
申请公布号 US2007195472(A1) 申请公布日期 2007.08.23
申请号 US20060648328 申请日期 2006.12.29
申请人 KWAK KOOK W;CHOI NAK H 发明人 KWAK KOOK W.;CHOI NAK H.
分类号 H02H9/00 主分类号 H02H9/00
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