发明名称 Cap layer for an aluminum copper bond pad
摘要 A bond pad for an electronic device such as an integrated circuit makes electrical connection to an underlying device via an interconnect layer. The bond pad has a first layer of a material that is aluminum and copper and a second layer, over the first layer, of a second material that is aluminum and is essentially free of copper. The second layer functions as a cap to the first layer for preventing copper in the first layer from being corroded by residual chemical elements. A wire such as a gold wire may be bonded to the second layer of the bond pad.
申请公布号 US2007194460(A1) 申请公布日期 2007.08.23
申请号 US20060360336 申请日期 2006.02.23
申请人 LEE CHU-CHUNG;HESS KEVIN J 发明人 LEE CHU-CHUNG;HESS KEVIN J.
分类号 H01L21/44 主分类号 H01L21/44
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