发明名称 Semiconductor memory
摘要 A bit line is connected to a charge storing circuit through a charge transferring circuit. A control circuit controls charge transferability of the charge transferring circuit according to a change in the voltage of the bit line resulting from a charge read out from a memory cell. A leakage controlling circuit lowers the charge transferability of the charge transferring circuit in a read operation temporarily before the charge is read out to the bit line. The leakage controlling circuit makes it possible to avoid charge transfer between the charge storing circuit and the bit line before data is read from the memory cell. The charge storing circuit can thus generate a read voltage sufficient for a read circuit to operate with, in accordance with the logical value of the data stored in the memory cell.
申请公布号 US2007195579(A1) 申请公布日期 2007.08.23
申请号 US20070790529 申请日期 2007.04.26
申请人 发明人 FUKUSHI ISAO;MORITA KEIZO;KAWASHIMA SHOICHIRO
分类号 G11C11/22 主分类号 G11C11/22
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