INTEGRATED CIRCUIT SELF-TEST ARCHITECTURE,申请号EP20050807208-传众专利搜索

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发明名称	INTEGRATED CIRCUIT SELF-TEST ARCHITECTURE
摘要
申请公布号	EP1820037(A1)	申请公布日期	2007.08.22
申请号	EP20050807208	申请日期	2005.11.23
申请人	KONINKLIJKE PHILIPS ELECTRONICS N.V.	发明人	PELGROM, MARCEL;VEENDRICK, HENDRICUS, J., M.
分类号	G01R31/3185;G01R31/3167	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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