发明名称 METHOD AND SYSTEM FOR LASER HARD MARKING
摘要 <p>A method and system for laser hard marking is provided. The laser-marking system produces a hard mark on a semiconductor wafer. The system includes a pulsed laser subsystem that produces a pulsed laser output for marking at a location on the wafer. The pulsed laser subsystem is controlled so that output pulse width remains substantially constant with a variation in at least one of pulse repetition rate and output energy over a range. A beam delivery system delivers the pulsed laser output to the location on the wafer.</p>
申请公布号 EP1819476(A1) 申请公布日期 2007.08.22
申请号 EP20050819869 申请日期 2005.11.11
申请人 GSI GROUP CORPORATION 发明人 GU, BO
分类号 B23K26/02;B23K26/06;B23K26/36;B23K26/40;B41J2/47;H01L21/00;H01L21/67;H01L23/544 主分类号 B23K26/02
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