| 摘要 |
An apparatus for obtaining images of sectional planes in a region of interest of an object under examination is provided, wherein the apparatus comprises a radiation source for irradiating the object with penetrating electromagnetic waves, a detector diametrically opposed to the radiation source across the object for detecting electromagnetic waves transmitted through the object, scanning means for moving the radiation source and/or the detector for scanning action, and localization means for determining the position of the radiation source and/or the detector. Preferably the apparatus further comprises computing means configured for computing a three dimensional image of the object under examination based on the position corrected images of the object determined in at least two scan positions.
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