发明名称 |
X-ray examination apparatus |
摘要 |
An x-ray examination apparatus comprises an x-ray source and an x-ray detector. The x-ray detector includes a photoconductor to derive electric charges from incident x-radiation and read-out elements which derive electrical pixel-signals from the electric charges from the photoconductor. A central group of the read-out elements is located in a central region of the x-ray detector and a peripheral group of the read-out elements is located in a peripheral region which surrounds the central region. The x-ray examination apparatus being provided with a selection system to select the central group of read-out elements so as to supply pixel-signals from the central group of read-elements to the output circuit. The selection system may include an encompassing electrode to drain electric charges from the peripheral group. Or the selection system shields the peripheral group from x-rays.
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申请公布号 |
US7260180(B2) |
申请公布日期 |
2007.08.21 |
申请号 |
US20050535058 |
申请日期 |
2005.05.13 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS, N.V. |
发明人 |
WIECZOREK HERFRIED KARL |
分类号 |
H05G1/58;H01L27/144;H01L27/146 |
主分类号 |
H05G1/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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