DIAGNOSTIC APPARATUS FOR FOCUSING ELECTRON BEAM IN MICROWAVE AMPLIFIER,申请号KR20050046419-传众专利搜索

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发明名称	DIAGNOSTIC APPARATUS FOR FOCUSING ELECTRON BEAM IN MICROWAVE AMPLIFIER
摘要
申请公布号	KR100751042(B1)	申请公布日期	2007.08.21
申请号	KR20050046419	申请日期	2005.05.31
申请人		发明人
分类号	H01J23/08	主分类号	H01J23/08
代理机构		代理人
主权项
地址

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