发明名称 Micro-tensile testing system
摘要 A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.
申请公布号 US7258022(B2) 申请公布日期 2007.08.21
申请号 US20050273480 申请日期 2005.11.14
申请人 发明人
分类号 G01L1/24 主分类号 G01L1/24
代理机构 代理人
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