发明名称 Operation of multiple select gate architecture
摘要 Methods of operating non-volatile memory devices including multiple series-coupled select gates on the drain and/or source ends of strings of non-volatile memory cells facilitate mitigation of gate-induced drain leakage and program disturb.
申请公布号 US7259991(B2) 申请公布日期 2007.08.21
申请号 US20050218848 申请日期 2005.09.01
申请人 MICRON TECHNOLOGY, INC. 发明人 ARITOME SEIICHI
分类号 G11C16/04 主分类号 G11C16/04
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