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发明名称
SEMICONDUCTOR MEMORY AND BURN-IN TEST METHOD OF SEMICONDUCTOR MEMORY
摘要
申请公布号
KR100750576(B1)
申请公布日期
2007.08.21
申请号
KR20050104222
申请日期
2005.11.02
申请人
发明人
分类号
G11C29/00
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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