发明名称 APPARATUS FOR PROCESSING SUBSTRATE WITH PLASMA
摘要 A plasma processing apparatus is provided to secure etching uniformity by flowing uniformly a reaction gas to an exhaust side using a round portion or a chamfered portion of an insulating member. A plasma processing apparatus includes an insulating member(116) for enclosing electrodes(114). The insulating member has the same width at corner portions of each electrode in lateral, longitudinal and orthogonal directions. A corner portion of the insulating member is rounded and is performed with a chamfering process. The corner portion of the electrode is formed like a round type structure or a chamfered type structure corresponding to the corner portion of the insulating member.
申请公布号 KR20070081895(A) 申请公布日期 2007.08.20
申请号 KR20060014161 申请日期 2006.02.14
申请人 ADP ENGINEERING CO., LTD. 发明人 KOO, BYUNG HEE
分类号 H01L21/02 主分类号 H01L21/02
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