发明名称 MEASURING DEVICE, TESTING DEVICE AND MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To accurately measure a signal whose voltage level is fluctuated based on a high voltage. SOLUTION: A measuring device measures fluctuation of the voltage level to a reference voltage of an input signal whose voltage level is fluctuated relative to the reference voltage having a prescribed voltage level. The measuring device is equipped with: a high-frequency passing section for passing a high-frequency component in a prescribed first band of the input signal; a reference voltage dividing part for dividing the voltage level of the reference voltage with a voltage division ratio determined beforehand; a signal voltage division part for dividing the voltage level of the input signal with the voltage division ratio; a low-frequency passing section for passing a low-frequency component in a second band lower than the first band of a differential signal corresponding to the difference between the voltage level of the reference voltage outputted from the reference voltage dividing part and the voltage level of the input signal outputted from the signal voltage division part; a synthesis part for synthesizing a signal outputted from the high-frequency pass section with a signal outputted from the low-frequency pass section; and a measuring part for measuring a signal outputted from the synthesis part. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007205793(A) 申请公布日期 2007.08.16
申请号 JP20060023273 申请日期 2006.01.31
申请人 ADVANTEST CORP 发明人 AMANUMA SEIJI;SUZUKI KIYONAGA
分类号 G01R31/28 主分类号 G01R31/28
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