发明名称 PHOTOSENSITIVE COMPOSITION AND PATTERN FORMING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a photosensitive composition for use in the production process of a semiconductor, such as IC, in the production of a circuit substrate of liquid crystal, thermal head and the like or in other photofabrication processes, which excels in exposure latitude and is improved in line edge roughness and pattern profile. <P>SOLUTION: The photosensitive composition contains (A) a compound, capable of generating an acid of a specific structure, represented by Formula (I) or Formula (I') upon irradiation with an actinic ray or radiation and (B) a basic compound having a specific benzimidazole skeleton. A pattern forming method using the same is also provided. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007206639(A) 申请公布日期 2007.08.16
申请号 JP20060028759 申请日期 2006.02.06
申请人 FUJIFILM CORP 发明人 TSUBAKI HIDEAKI
分类号 G03F7/004;G03F7/039;G03F7/085;H01L21/027 主分类号 G03F7/004
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