发明名称 SEMICONDUCTOR SUBSTRATE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a deforming Si substrate with a sufficiently reduced defect and high quality. SOLUTION: A manufacturing method of a semiconductor substrate includes a step of varying stress to a hetero-epitaxial layer to change the deformation of a Si layer on a support substrate at least containing a structure including the hetero-epitaxial layer with a different grating constant from that of the support substrate, a porous layer and the Si layer sequentially laminated. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007208189(A) 申请公布日期 2007.08.16
申请号 JP20060028507 申请日期 2006.02.06
申请人 CANON INC 发明人 NISHIDA AKIYUKI;IKEDA HAJIME
分类号 H01L21/20;H01L21/205 主分类号 H01L21/20
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