| 摘要 |
A magnetic head testing apparatus and a method of testing a magnetic head cause electromagnetic waves to act upon a magnetic head and therefore can test the characteristics of a magnetic head more precisely and improve the quality of magnetic heads. The magnetic head testing apparatus includes: a magnetic field generating unit for causing a magnetic field to act upon a tested object on which a magnetic head including an MR element is formed; a resistance detecting unit for measuring changes in resistance of the MR element of the magnetic head formed on the tested object when the intensity of the magnetic field is increased and decreased by the magnetic field generating unit; and an electromagnetic wave generating unit for causing electromagnetic waves to act upon the tested object to detect the characteristics of the tested object in an environment where electromagnetic waves act thereupon.
|
