发明名称 Semiconductor device having a trench gate and method of fabricating the same
摘要 A method of fabricating a semiconductor device having a trench gate is provided. First, a semiconductor substrate having a trench etch mask thereon is provided. The semiconductor substrate is etched to form a trench having a sidewall and a bottom using the trench etch mask as a shield. Impurities are doped into the semiconductor substrate through the trench to form a doped region. The semiconductor substrate underlying the trench is etched to form an extended portion. A gate insulating layer is formed on the trench and the extended portion. A trench gate is formed in the trench and the extended portion.
申请公布号 US2007190712(A1) 申请公布日期 2007.08.16
申请号 US20060521639 申请日期 2006.09.14
申请人 NANYA TECHNOLOGY CORPORATION 发明人 LIN SHIAN-JYH;CHENG CHIEN-LI;LEE CHUNG-YUAN;LIN JENG-PING;LEE PEI-ING
分类号 H01L21/8234 主分类号 H01L21/8234
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