| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state imaging apparatus capable of detecting drawbacks related to signal lines for control connected to pixels. SOLUTION: The solid-state imaging apparatus 100 having a pixel array 101 consisting of one or more pixels is provided with a first H-level detecting circuit 104, a first L-level detecting circuit 105, a second H-level detecting circuit 108 and a second L-level detecting circuit 109 for detecting potentials to be generated in the signal lines for control connected to the pixels. The first H-level detecting circuit 104 and the second H-level detecting circuit 108 detect potentials to be generated when H-level potentials are supplied to the signal lines for control. The first L-level detecting circuit 105 and the second L-level detecting circuit 109 detect potentials to be generated when L-level potentials are supplied to the signal lines for control. COPYRIGHT: (C)2007,JPO&INPIT
|
