发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of reducing the voltage dependency of a capacitance value and improving a frequency chracteristic of the capacitance value. SOLUTION: The semiconductor device 100 comprises a MOS capacitor 4 for forming capacitance between drain regions 7, 9 and a source region 8 commonly connected and gate electrodes 12, 13; and a wiring capacitor 5 having first comb-shaped wiring 16 having an extension part 16a extending in a comb-shape way, and a second comb-shaped wiring 17 arranged through the first comb-shaped wiring 16 and a line insulating film 21 and having an extension part 17a connected to the drain regions 7, 9 and the source region 8 and extending in the comb-shape way. The 17a of the second comb-shaped wiring 17 and the part 16a of the first comb-shaped wiring 16 are arranged alternately, and arranged vertically to a channel direction for connecting the drain regions 7, 9 and the source region 8 of the MOS capacitor 4. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007208101(A) 申请公布日期 2007.08.16
申请号 JP20060026782 申请日期 2006.02.03
申请人 TOSHIBA CORP 发明人 WADA OSAMU;NAMEGAWA TOSHIMASA;NAKANO HIROAKI;ITO HIROSHI;NAKAYAMA ATSUSHI
分类号 H01L21/822;H01L21/8234;H01L27/04;H01L27/06 主分类号 H01L21/822
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