发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method thereof capable of optimizing each element of a plurality of TLPMs formed on the same semiconductor substrate with high precision and reducing the manufacturing cost thereof. SOLUTION: The depth of a first trench of NchTLPM is made smaller than the depth of a second trench 12 of PchTLPM in a complementary TLPM, so that the channel length of the NchTLPM is optimized and the ON-state resistance can be made small. Further, the same mask is used to form the first trench and a first n-drain region, and the same mask is used to form the second trench and a first p-drain region, so that photo-processes can be reduced. Accordingly, the cost can be reduced. Moreover, the first n-drain region can be formed with high precision by self-aligning. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007208073(A) 申请公布日期 2007.08.16
申请号 JP20060026188 申请日期 2006.02.02
申请人 FUJI ELECTRIC DEVICE TECHNOLOGY CO LTD 发明人 KITAMURA MUTSUMI
分类号 H01L21/8238;H01L21/8234;H01L27/088;H01L27/092;H01L29/78 主分类号 H01L21/8238
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