CAPACITANCE TYPE DISPLACEMENT GAUGE AND METHOD FOR MEASURING DEFORMATION OF A SPECIMEN USING THE SAME

摘要

A capacitance type displacement gauge and a method for measuring the deformation of a specimen using the same are provided to give an effect of measuring the deformation of the specimen with the linearity of improved measurement in real time. A capacitance type displacement gauge(1) includes a frame(10), first and second grips(20,30) to support both ends of the specimen, and an electrode unit(60) to generate a capacitance change corresponding to the deformation of the specimen. The frame is consisted of a bottom frame unit(12), a middle frame unit(14), and a top frame unit(16). The electrode unit and the first grip are positioned at the bottom frame unit. The middle frame unit performs an installation and separation of the specimen. The second grip is fixed to the top frame unit. A first electrode(62) is positioned at an inside cavity by integrated with the first grip and the second grip moved up and down by an actuator(40). The electrode unit further includes a second electrode(64) and a third electrode(66). The second electrode and the third electrode are faced to the first electrode with a predetermined distance at an inner surface of the bottom frame unit.