| 摘要 |
PROBLEM TO BE SOLVED: To control a change of a supply voltage to be supplied to a device to be tested. SOLUTION: A testing device for testing a device to be tested is equipped with: a reference voltage supply part for supplying a reference voltage; a field effect transistor wherein a drain terminal and a source terminal are connected in parallel to the test device between a positive side terminal and a negative side terminal of the reference voltage supply part; an inductance connected in series between the positive side terminal and the negative side terminal of the reference voltage supply part, between a positive side power terminal and a negative side power terminal of the test device, and between the drain terminal and the source terminal of the field effect transistor; a control part for changing the supply voltage to be supplied to the test device by controlling a gate voltage of the field effect transistor; and a determination part for determining the quality of the test device, based on the characteristic of the device to be tested corresponding to the change of the supply voltage. COPYRIGHT: (C)2007,JPO&INPIT
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