| 摘要 |
<p>The present invention relates to the use of ultraviolet (UV) radiation in crystallography. More specifically, the present invention relates to a method of inducing specific changes in a crystal of a compound, a method of generating X-ray diffraction data from a compound, and a method of determining a three-dimensional structure of a compound. Said methods are based on UV radiation induced changes in the crystal structure of a compound, which allow to obtain phase information from X-ray diffraction data collected from said crystal and thus to solve the three- dimensional structure of the compound. Furthermore, the present invention relates to a device for determining a three-dimensional structure of a compound comprising an X-ray diffractometer and a UV radiation source. Moreover, the present invention relates to the use of a UV radiation source.</p> |
