发明名称 Precise x-ray inspection system
摘要 Methods and apparatus for reducing detection of x-ray scatter in an x-ray system are described featuring one or more x-ray sources, one or more sensors, one or more field blocks configured to limit the field of view of the one or more sensors, one or more collimators configured to direct x-rays generated by the one or more x-ray sources in the direction of the one or more sensors, and a relative motion mechanism configured to alter a position of an object under inspection relative to the x-ray source and the one or more sensors.
申请公布号 US2007189460(A1) 申请公布日期 2007.08.16
申请号 US20060355062 申请日期 2006.02.15
申请人 BUCK DEAN C;KERSCHNER RONALD K;REYNOLDS DAVID C 发明人 BUCK DEAN C.;KERSCHNER RONALD K.;REYNOLDS DAVID C.
分类号 G21K5/10 主分类号 G21K5/10
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