发明名称 CHANGE POINT DETECTION CIRCUIT, JITTER MEASUREMENT DEVICE, AND TEST DEVICE
摘要 <p>A change point detection circuit detects a timing of a change point where a logical value of a signal to be measured changes. The change point detection circuit includes: a multi strobe circuit for generating a logical value data string obtained by detecting logical values of signals to be measured according to strobes of different phases; a change point detection unit for detecting in which strobe the logical value changes according to the logical value data string; an edge specification storage unit for storing in advance specification concerning the change point of which edge type, i.e., the rise edge or the fall edge of the signal to be measured is to be detected; a selection unit for selecting a change point corresponding to the edge type stored in the edge specification storage unit among the change points detected by the change point detection unit; and a strobe position storage unit for storing to which strobe the change point selected by the selection unit corresponds.</p>
申请公布号 WO2007091413(A1) 申请公布日期 2007.08.16
申请号 WO2007JP50718 申请日期 2007.01.18
申请人 ADVANTEST CORPORATION;BABA, TADAHIKO;NIIJIMA, HIROKATSU 发明人 BABA, TADAHIKO;NIIJIMA, HIROKATSU
分类号 G01R31/319;G01R29/02;H03K5/153 主分类号 G01R31/319
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