发明名称 INSPECTION METHOD OF IRON-BASED STRUCTURE, AND MAGNETIC IMPEDANCE EFFECT SENSOR
摘要 PROBLEM TO BE SOLVED: To provide a method for accurately and easily inspecting an iron-based structure with a magnetic impedance effect sensor. SOLUTION: A sensor having a magnetic impedance effect element is moved along the iron-based structure while the exciting current is carried to the magnetic impedance effect element and bias magnetic field obtained by superimposing an alternating current component on a direct current component. The iron-based structure serves as part of a magnetic circuit with respect to the bias magnetic field, the intensity of the bias magnetic field varies according to the degree of a flaw/corrosion/thickness reduction of the iron-based structure, and the degree of a defect of the iron-based structure is inspected according to the output variation. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007205888(A) 申请公布日期 2007.08.16
申请号 JP20060025183 申请日期 2006.02.02
申请人 UCHIHASHI ESTEC CO LTD;TOHOKU ELECTRIC POWER CO INC;SII NANOTECHNOLOGY INC 发明人 TOYODA KAZUMI;NAKAYAMA SATORU;IZAWA KAZUYUKI
分类号 G01N27/82;G01N27/72;G01R33/02 主分类号 G01N27/82
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