发明名称 |
INSPECTION METHOD OF IRON-BASED STRUCTURE, AND MAGNETIC IMPEDANCE EFFECT SENSOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for accurately and easily inspecting an iron-based structure with a magnetic impedance effect sensor. SOLUTION: A sensor having a magnetic impedance effect element is moved along the iron-based structure while the exciting current is carried to the magnetic impedance effect element and bias magnetic field obtained by superimposing an alternating current component on a direct current component. The iron-based structure serves as part of a magnetic circuit with respect to the bias magnetic field, the intensity of the bias magnetic field varies according to the degree of a flaw/corrosion/thickness reduction of the iron-based structure, and the degree of a defect of the iron-based structure is inspected according to the output variation. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007205888(A) |
申请公布日期 |
2007.08.16 |
申请号 |
JP20060025183 |
申请日期 |
2006.02.02 |
申请人 |
UCHIHASHI ESTEC CO LTD;TOHOKU ELECTRIC POWER CO INC;SII NANOTECHNOLOGY INC |
发明人 |
TOYODA KAZUMI;NAKAYAMA SATORU;IZAWA KAZUYUKI |
分类号 |
G01N27/82;G01N27/72;G01R33/02 |
主分类号 |
G01N27/82 |
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