发明名称 |
Stress and strain analysis method and its equipment |
摘要 |
Provided are a stress analysis method and stress analysis equipment that enable a detailed stress measurement, by using both a photoelasticity measurement method and a stress measurement (mechanoluminescence measurement) which utilizes a mechanoluminescent substance to measure a stress state of an object. Physical quantities that are measurable include individual principal stress component and a principal stress direction. The photoelasticity measurement method alone cannot measure individual principal stress component values.
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申请公布号 |
US2007186674(A1) |
申请公布日期 |
2007.08.16 |
申请号 |
US20070655219 |
申请日期 |
2007.01.19 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIALS SCIENCE AND TECHNOLOGY |
发明人 |
HYODO KOJI;XU CHAO-NAN;YAMANE TAKASHI;AKAMATSU MOTOYUKI;YOKOGAWA YOSHIYUKI;KAMEYAMA TETSUYA |
分类号 |
G01N3/08 |
主分类号 |
G01N3/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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