发明名称 Stress and strain analysis method and its equipment
摘要 Provided are a stress analysis method and stress analysis equipment that enable a detailed stress measurement, by using both a photoelasticity measurement method and a stress measurement (mechanoluminescence measurement) which utilizes a mechanoluminescent substance to measure a stress state of an object. Physical quantities that are measurable include individual principal stress component and a principal stress direction. The photoelasticity measurement method alone cannot measure individual principal stress component values.
申请公布号 US2007186674(A1) 申请公布日期 2007.08.16
申请号 US20070655219 申请日期 2007.01.19
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIALS SCIENCE AND TECHNOLOGY 发明人 HYODO KOJI;XU CHAO-NAN;YAMANE TAKASHI;AKAMATSU MOTOYUKI;YOKOGAWA YOSHIYUKI;KAMEYAMA TETSUYA
分类号 G01N3/08 主分类号 G01N3/08
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