发明名称 Device and method for testing a non-volatile reprogrammable memory
摘要 <p>The invention relates to a device for testing a reprogramable non-volatile memory having dedicated areas protectable in reading, writing and/or erasing and whose access rights consist of configuration words (MC) saved in a configuration area of the memory, said device comprising message transmission/reception means (10) and a received message logic control unit (11) and access controls to the memory, characterized in that it comprises at least one temporary register ensuring an emulation of these access rights, so as to render access protections reversible or irreversible. The invention also relates to the process performed by said device.</p>
申请公布号 EP1030314(B1) 申请公布日期 2007.08.15
申请号 EP20000400118 申请日期 2000.01.18
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 BILLIOT, GERARD;CROCHON, ELISABETH
分类号 G11C29/00;G11C29/46;G11C29/52 主分类号 G11C29/00
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