SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD FOR THE SAME,申请号KR20010049942-传众专利搜索

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发明名称	SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD FOR THE SAME
摘要
申请公布号	KR100748921(B1)	申请公布日期	2007.08.14
申请号	KR20010049942	申请日期	2001.08.20
申请人		发明人
分类号	G01R31/28;G11C29/00;G01R31/3185;G11C7/06;G11C29/06;G11C29/50	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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