发明名称 Method for treating a wafer edge
摘要 A method for treating an edge portion of a wafer with a plasma or select chemical formulation in order to enhance adhesion characteristics and inhibit delamination of a layer of material from the wafer surface only on the edge portion that is being treated. Alternatively, the method may be utilized to effectuate a cleaning of an edge portion of a wafer.
申请公布号 US7256148(B2) 申请公布日期 2007.08.14
申请号 US20050908441 申请日期 2005.05.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KASTENMEIER BERND E.;KNORR ANDREAS
分类号 H01L21/26 主分类号 H01L21/26
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