发明名称 |
Probe card, having cantilever-type probe and method |
摘要 |
A probe card is used to test an electronic device. The probe card includes a base plate and a cantilever-type probe arranged on the base plate. The cantilever-type probe has an end that contacts the contacted body and moves when contacting the contacted body. A stopper arranged on the base plate restricts the movement of the cantilever-type probe.
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申请公布号 |
US7256591(B2) |
申请公布日期 |
2007.08.14 |
申请号 |
US20020284085 |
申请日期 |
2002.10.31 |
申请人 |
FUJITSU LIMITED |
发明人 |
TATEMATSU TSUTOMU;TOGASHI KENJI;NANBU TETSUHIRO;ISHIHARA SHIGENOBU;HAMADA MORIHIKO;ARISAKA YOSHIKAZU;ITAGAKI KUNIHIRO;AOKI SHIGEKAZU |
分类号 |
G01R31/02;G01R1/073 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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