发明名称 SEMICONDUCTOR MEMORY DEVICE CONTROLLING OUTPUT VOLTAGE LEVEL OF HIGH VOLTAGE GENERATOR ACCORDING TO TEMPERATURE VARATION
摘要 A semiconductor memory device controlling an output voltage level of a high voltage generator according to temperature variation is provided to prevent the degradation of program or erase characteristics of a memory cell. A semiconductor memory device(100) includes a memory cell array(110) and a high voltage generator(120). The high voltage generator provides a high voltage higher than a power supply voltage to the memory cell array through an output port, and generates a temperature detection signal by detecting the variation of a diode current according to temperature variation, and controls the voltage level of the output port in response to the temperature detection signal. The high voltage generator includes a pump circuit(130) generating the high voltage by pumping the power supply voltage, a regulator(140) regulating the output voltage of the pump circuit in response to the temperature detection signal, and a temperature detector(150) generating the temperature detection signal by detecting the variation of the diode current according to temperature variation.
申请公布号 KR20070080492(A) 申请公布日期 2007.08.10
申请号 KR20060011851 申请日期 2006.02.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG, HWI TAEK
分类号 G11C7/04;G11C5/14 主分类号 G11C7/04
代理机构 代理人
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