发明名称 A PROBING ASSEMBLY FOR TESTING FLAT PANEL DISPLAY DEVICE
摘要 A probe assembly for testing a flat panel display device is provided to test plural flat panel display device easily at the same time by quickly aligning probe pins when testing various kinds of flat panel display devices. A base block(100) includes a horizontal plate and a vertical plate. A vertically moving block is arranged on the base block. A pair of digital scales are arranged to be moved in a horizontal direction when guided by a scale bar, which is coupled with a scale bar fixing block. Plural probe pins, where test terminals are contacted, are coupled with a pair of probe pin fixing blocks. A probe pin module is coupled with one lower end of the probe pin fixing block. A jig fixing block(106) is coupled with the horizontal plate of the base block. A jig(124) is mounted on the jig fixing block and tests a flat panel display device thereon. A vertical guide rail(120) is coupled with the vertical plate of the base block. A vertical guide block is coupled with the vertically moving block and the vertical guide rail. The probe pin fixing blocks are coupled with the respective digital scales. A display is formed on the digital scale, which displays a moving distance of the digital scale.
申请公布号 KR100750466(B1) 申请公布日期 2007.08.10
申请号 KR20060016660 申请日期 2006.02.21
申请人 KANG, SEONG IL 发明人 KANG, SEONG IL
分类号 H05B33/10 主分类号 H05B33/10
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