发明名称 SUBSTRATE ALIGN APPARATUS REDUCING OCCURENCE OF MISALIGN AND SUBSTRATE ALIGN METHOD
摘要 <p>A substrate aligning apparatus and a substrate aligning method are provided to restrain the generation of an alignment failure in a substrate aligning process by using an illumination source and a camera. A substrate aligning apparatus includes an alignment light source, a diffractive light sensor, an illumination source and a camera. The alignment light source(10) irradiates an alignment light to an alignment mark. The diffractive light sensor(15) is used for detecting a diffractive light generated from the alignment light due to the alignment mark. The illumination source(20) is used for illuminating the alignment mark. The camera(25) is used for photographing the illuminated alignment mark.</p>
申请公布号 KR20070080447(A) 申请公布日期 2007.08.10
申请号 KR20060011772 申请日期 2006.02.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 RYU, KEUM YONG
分类号 H01L21/027 主分类号 H01L21/027
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