发明名称 |
Method for recording microstructural changes in a component |
摘要 |
The microstructure of components, particularly layer systems, deteriorates under excessive thermal and/or mechanical stress. Previous test methods are destructive, parts being cut out of the layer system and being microstructurally analyzed. The inventive method allows a deterioration to be determined by means of special, simple non-destructive measurements that are repeated at specific intervals using a mechanical indenter test, for example.
|
申请公布号 |
US2007180897(A1) |
申请公布日期 |
2007.08.09 |
申请号 |
US20050589791 |
申请日期 |
2005.02.14 |
申请人 |
DANKERT MICHAEL;FELDHEGE MARTIN;IRMISCH STEFAN;OECHSNER MATTHIAS;SCHUMANN ECKART;STAMM WERNER |
发明人 |
DANKERT MICHAEL;FELDHEGE MARTIN;IRMISCH STEFAN;OECHSNER MATTHIAS;SCHUMANN ECKART;STAMM WERNER |
分类号 |
F01L1/46;F01D21/00;G01M13/00;G01M15/14;G01N25/18;G01N27/00;G01N27/20;G01N27/24 |
主分类号 |
F01L1/46 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|