发明名称 E-beam lithography system for synchronously irradiating a plurality of photomasks and method of fabricating photomasks using the same
摘要 Disclosed is an E-beam lithography system for synchronously irradiating surfaces of a plurality of substrates. The E-beam lithography system may include a loading unit loading and unloading substrates, an alignment chamber aligning the substrates, a transfer chamber transferring the substrates from the loading unit or chambers, a lithography chamber radiating one or more electron beams onto the substrates, and a vacuum chamber creating a vacuum in the chambers. A stage may be installed in the lithography chamber such that the substrates may be mounted on the stage and radiated with one or more electron beams.
申请公布号 US2007181828(A1) 申请公布日期 2007.08.09
申请号 US20070656467 申请日期 2007.01.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON JE-BUM;KOH CHA-WON;JUNG MYOUNG-HO;YEO GI-SUNG;KIM SANG-JIN
分类号 G21G5/00 主分类号 G21G5/00
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