发明名称 HIGH-FREQUENCY CHARACTERISTIC MEASURING TOOL
摘要 PROBLEM TO BE SOLVED: To provide a high-frequency characteristic measuring tool capable of obtaining a desired characteristic impedance, and capable of eliminating erroneous measurement caused by dust. SOLUTION: In this high-frequency characteristic measuring tool, each annular probe holder 31 is fixed in two portions of an outer circumference of each contact probe 21 for a high-frequency signal, and the annular probe holder 31 is fit to a through-hole 3 of a metal block 2 to be positioned on an upper face part and an under face part of the metal block 2. A hollow part is formed between the contact probe 21 for the high-frequency signal and the metal block 2, and the contact probe 21 for the high-frequency signal is used as the center conductor and the metal block 2 is used as an outer conductor, to serve as a coaxial line of the desired characteristic impedance. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007198835(A) 申请公布日期 2007.08.09
申请号 JP20060016265 申请日期 2006.01.25
申请人 MURATA MFG CO LTD 发明人 NAKADA KEIICHI
分类号 G01R31/26;G01R1/067;G01R1/073 主分类号 G01R31/26
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